Co-author Network

Co-researcher Network

ENTRENA ARRONTES, LUIS ALFONSO Close

category: Full Professor

https://orcid.org/0000-0001-6021-165X

Positions

Academic Department : Electronic Technology
Research Group : Microelectronic Design and Applications (DMA)
Institute : Pedro Juan de Lastanosa Institute of Technology Development and Innovation

Contact Info

entrena@ing.uc3m.es >> Other Contact Information

Publications
Projects
Other

sample of publications

articles
- Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions. MICROELECTRONICS RELIABILITY. 100-101. 2019
- Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection. MICROELECTRONICS RELIABILITY. 100-101. 2019
- PTM-based hybrid error-detection architecture for ARM microprocessors. MICROELECTRONICS RELIABILITY. 88:925-930. 2018
- Total ionizing dose effects on a delay-based physical unclonable function implemented in FPGAs. Electronics. 7. 2018
- Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 65:1835-1842. 2018
- On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation. Entropy. 20. 2018
- Dynamic control of entropy and power consumption in TRNGs for IoT applications. IEICE Electronics Express. 15:1-11. 2018
- Towards a Dependable True Random Number Generator With Self-Repair Capabilities. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. 65:247-256. 2018
- A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 64:374-381. 2017
- Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches. IEEE TRANSACTIONS ON RELIABILITY. 65:1871-1883. 2016
- Partial TMR in FPGAs Using Approximate Logic Circuits. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 63:2233-2240. 2016
- A Hardware-Software Approach for On-Line Soft Error Mitigation in Interrupt-Driven Applications. IEEE Transactions on Dependable and Secure Computing. 13:502-508. 2016
- Online test of control flow errors: a new debug interface-based approach. IEEE TRANSACTIONS ON COMPUTERS. 65:1846-1855. 2016
- Using Benchmarks for Radiation Testing of Microprocessors and FPGAs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 62:2547-2554. 2015
- A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 61:3236-3243. 2014
- Efficient mitigation of data and control-flow errors in microprocessors. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 61:1590-1596. 2014
- Low-Power Design in Aerospace Circuits: A Case Study. IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE. 28:46-52. 2013
- SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 60:2813-2818. 2013
- Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 28:777-789. 2012
- A co-design approach for SET mitigation in embedded systems. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 59:1034-1039. 2012
- Constrained Placement Methodology for Reducing SER Under Single-Event-Induced Charge Sharing Effects. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 59:811-817. 2012
- On the use of embedded debug features for permanent and transient fault resilience in microprocessors. MICROPROCESSORS AND MICROSYSTEMS. 36:334-343. 2012
- Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection. IEEE TRANSACTIONS ON COMPUTERS. 61:313-322. 2012
- Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 58 :2768-2775. 2011
- Analysis of SET effects in a PIC microprocessor for selective hardening. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 58:1078-1085. 2011
- Sensitivity Evaluation Method for Aerospace Digital Systems With Collaborative Hardening. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 58:1053-1058. 2011
- Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures. IEEE Transactions on Dependable and Secure Computing. 8:308-314. 2011
- Extensive SEU Impact Analysis of a PIC Microprocessor for Selective Hardening. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 57:1986-1991. 2010
- SET Emulation Considering Electrical Masking Effects. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 56:2015-2021. 2009
- Analysis of Turbo Decoder Robustness Against SEU Effects. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 56:2184-2188. 2009
- SET Emulation under a Quantized Delay Model. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 25:107-116. 2009
book chapters
- Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications. SPRINGER. 293-293-306. 2016
- Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems. SPRINGER. 141-166. 2010
conference contributions