sample of publications

• articles 

  • Error Mitigation Using Optimized Redundancy for Composite Algorithms in FPGAs.  IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS.  60:2143-2152. 2024
  • Supervised Triple Macrosynchronized Lockstep (STMLS) Architecture for Multicore Processors.  IEEE Access.  11:128706-128723. 2023
  • Formal Verification of Fault-Tolerant Hardware Designs.  IEEE Access.  40:116127-116140. 2023
  • Evaluating Reduced Resolution Redundancy for Radiation Hardening in FPGA Designs.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  70. 2023
  • Analyzing Scaled Reduced Precision Redundancy for Error Mitigation under Proton Irradiation.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  69:1485-1491. 2022
  • Hybrid Lockstep Technique for Soft Error Mitigation.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  69:1574-1581. 2022
  • Reliability Evaluation of LU Decomposition on GPU-Accelerated System-on-Chip Under Proton Irradiation.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  69:1467-1474. 2022
  • Analyzing Reduced Precision Triple Modular Redundancy under Proton Irradiation.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  69:470-477. 2022
  • Comparison of parallel implementation strategies in GPU-accelerated System-on-Chip under proton irradiation.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  69:444-452. 2022
  • Reduced resolution redundancy: A novel approximate error mitigation technique.  IEEE Access.  10:20643-20651. 2022
  • Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOS.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  69:462-469. 2021
  • Error sensitivity study of FFT architectures implemented in FPGA.  MICROELECTRONICS RELIABILITY.  126:1-5. 2021
  • Using Approximate Circuits Against Hardware Trojans.  IEEE Design & Test.  2021
  • Microprocessor error diagnosis by trace monitoring under laser testing.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  68:1651-1659. 2021
  • Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  67:1452-1460. 2020
  • A true random number generator based on gait data for the Internet of You.  IEEE Access.  8:71642-71651. 2020
  • The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  67:126-134. 2020
  • Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions.  MICROELECTRONICS RELIABILITY.  100-101:113346. 2019
  • Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection.  MICROELECTRONICS RELIABILITY.  100-101:113447. 2019
  • Online error detection through trace infrastructure in ARM microprocessors.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  66:1457-1464. 2019
  • PTM-based hybrid error-detection architecture for ARM microprocessors.  MICROELECTRONICS RELIABILITY.  88-90:925-930. 2018
  • Total ionizing dose effects on a delay-based physical unclonable function implemented in FPGAs.  Electronics.  7. 2018
  • Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  65:1835-1842. 2018
  • On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation.  Entropy.  20. 2018
  • Dynamic control of entropy and power consumption in TRNGs for IoT applications.  IEICE Electronics Express.  15:1-11. 2018
  • Towards a Dependable True Random Number Generator With Self-Repair Capabilities.  IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS.  65:247-256. 2018
  • A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  64:374-381. 2017
  • Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches.  IEEE TRANSACTIONS ON RELIABILITY.  65:1871-1883. 2016
  • Partial TMR in FPGAs Using Approximate Logic Circuits.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  63:2233-2240. 2016
  • A hardware-software approach for on-line soft error mitigation in interrupt-driven applications.  IEEE Transactions on Dependable and Secure Computing.  13:502-508. 2016
  • Online test of control flow errors: a new debug interface-based approach.  IEEE TRANSACTIONS ON COMPUTERS.  65:1846-1855. 2016
  • Using Benchmarks for Radiation Testing of Microprocessors and FPGAs.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  62:2547-2554. 2015
  • A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  61:3236-3243. 2014
  • Efficient mitigation of data and control-flow errors in microprocessors.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  61:1590-1596. 2014
  • Low-Power Design in Aerospace Circuits: A Case Study.  IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE.  28:46-52. 2013
  • Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach.  JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS.  28:777-789. 2012
  • A co-design approach for SET mitigation in embedded systems.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  59:1034-1039. 2012
  • Constrained Placement Methodology for Reducing SER Under Single-Event-Induced Charge Sharing Effects.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  59:811-817. 2012
  • On the use of embedded debug features for permanent and transient fault resilience in microprocessors.  MICROPROCESSORS AND MICROSYSTEMS.  36:334-343. 2012
  • Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection.  IEEE TRANSACTIONS ON COMPUTERS.  61:313-322. 2012
  • Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  58 :2768-2775. 2011
  • Analysis of SET effects in a PIC microprocessor for selective hardening.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  58:1078-1085. 2011
  • Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures.  IEEE Transactions on Dependable and Secure Computing.  8:308-314. 2011
  • SET Emulation Considering Electrical Masking Effects.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  56:2015-2021. 2009
  • Analysis of Turbo Decoder Robustness Against SEU Effects.  IEEE TRANSACTIONS ON NUCLEAR SCIENCE.  56:2184-2188. 2009
  • SET Emulation under a Quantized Delay Model.  JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS.  25:107-116. 2009

• book chapters 

  • Fault-tolerance techniques for soft-core processors using the trace interface. In: FPGAs and parallel architectures for aerospace applications.  SPRINGER. 293-293-306. 2016
  • Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems.  SPRINGER. 141-166. 2010

• conference contributions 

  • Comparative of proton radiation data for 28 nm Zynq-7000 SoC 2022
  • High complexity reliable Space applications in commercial microprocessors.  1-5. 2022
  • Impact of atmospheric and space radiation on sensitive electronic devices 2022
  • Evaluating Fundamental Matrix Operations on Multi-core System-on-Chip 2021
  • Evaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessor.  1-6. 2021
  • Evaluation of a multiprocessor system hardened with macro-synchronized lockstep with FreeRTOS OS using proton irradiation 2021
  • Evaluating the soft error sensitivity of a GPU-based SoC for matrix multiplication.  1-6. 2020
  • Fault Injection and Formal Verification Methodologies 2019
  • Radiation Effects and Mitigation Techniques in FPGAs: the Complexity Challenge (Short Course Program "Prepare for the next decade") 2019
  • Approximate TMR for selective error mitigation in FPGAs based on testability analysis.  112-119. 2018
  • Flexible approaches to fault-tolerant microprocessors for space aplications 2015
  • The Use of Benchmarks for High-Reliability Systems 2015
  • A New Hybrid Non-Intrusive Error-Detection Technique Using Dual Control-Flow Monitoring 2014
  • A method to assess the robustness of cryptographic circuits at the design stage.  1354-1360. 2014
  • A new solution to on-line detection of Control Flow Errors.  105-110. 2014
  • Assesing SET Sensitivity of PLL.  1-6. 2014
  • Assessing SET sensitivity of a PLL.  1-6. 2014
  • Comparative of software-based hardening techniques for LEON 3 microprocessor 2014
  • Error masking with approximate logic circuits using dynamic probability estimations.  134-139. 2014
  • C-Element model for SET fault emulation.  1-4. 2013
  • Exploiting the debug interface to support on-line test of control flow errors.  98-103. 2013
  • SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block.  2813-2818. 2013
  • Approximate logic functions for SET mitigation in sequential circuits.  195-200. 2012
  • Logic Masking for SET Mitigation Using Approximate Logic Circuits.  176-181. 2012
  • SET Fault Injection Attacks on a Hardware Implementation of the SHA Cypher 2012
  • SEU Sensitivity of Robust Communication Protocols.  188-193. 2012
  • A Recovery Mechanism for SET Protection Using Standard-Cells.  128-131. 2011
  • ATOM: A Pseudorandom Number Generator Suitable for RFID Protocols 2011
  • Akari-X: A Pseudorandom Number Generator for Secure Lightweight Systems.  228-233. 2011
  • Control Flow Checking through Embedded Debug Interface 2011
  • Sensitivity Evaluation Method for Aerospace Digital Systems with Collaborative Hardening.  1053-1058. 2011
  • Study on the Effect of Multiple Errors in Robust Systems Based on Critical Task Distribution.  463-466. 2011
  • Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness Under SEEs: A Case Study 2011
  • Extensive SEU impact analysis of a PIC microprocessor for selective hardening.  1986-1991. 2010
  • Analysis of Turbo Decoder Robustness Against SEU Effects 2008
  • Coarse-Grain Dynamically Reconfigurable Coprocessor for Image Processing in SoPC 2008
  • Redundancia temporal configurable para algoritmos criptográficos robustos 2008
  • SET Emulation Considering Electrical Masking Effects 2008
  • Smart Hardening for Round-based Encryption Algoritms: Application to Advanced Encryptijon Standard 2008
  • The Effects of Proton Irradiation on CoolRunner-II CPLD Technology 2008