Using Benchmarks for Radiation Testing of Microprocessors and FPGAs Articles uri icon

authors

  • QUINN, HEATHER
  • ROBINSON, WILLIAM H.
  • RECH, PAOLO
  • AGUIRRE, MIGUEL
  • BARNARD, ARNO
  • DESOGUS, MARCO
  • ENTRENA ARRONTES, LUIS ALFONSO
  • GARCIA VALDERAS, MARIO
  • GUERTÍN, STEVEN M.
  • KAELI, D.
  • KASTENSMIDT, FERNANDA LIMA
  • KIDDIE, BRADLEY T.
  • SANCHEZ CLEMENTE, ANTONIO JOSE
  • SONZA REORDA, MATTEO
  • STERPONE, LUCA
  • WIRTHLIN, MICHAEL

publication date

  • December 2015

start page

  • 2547

end page

  • 2554

issue

  • 6

volume

  • 62

international standard serial number (ISSN)

  • 0018-9499

electronic international standard serial number (EISSN)

  • 1558-1578

abstract

  • Performance benchmarks have been used over the years to compare different systems. These benchmarks can be useful for researchers trying to determine how changes to the technology, architecture, or compiler affect the system's performance. No such standard exists for systems deployed into high radiation environments, making it difficult to assess whether changes in the fabrication process, circuitry, architecture, or software affect reliability or radiation sensitivity. In this paper, we propose a benchmark suite for high-reliability systems that is designed for field-programmable gate arrays and microprocessors. We describe the development process and report neutron test data for the hardware and software benchmarks.

keywords

  • field-programmable gate arrays (fpgas); soft error rates; soft errors; software fault tolerance; fault-tolerance; seu; systems; design; level; cmos; tool