abbreviation
- IEEE T NUCL SCI
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Journal
Overview
publication venue for
- Analyzing Scaled Reduced Precision Redundancy for Error Mitigation under Proton Irradiation. 69. 2022
- Hybrid Lockstep Technique for Soft Error Mitigation. 69. 2022
- Reliability Evaluation of LU Decomposition on GPU-Accelerated System-on-Chip Under Proton Irradiation. 69. 2022
- Analyzing Reduced Precision Triple Modular Redundancy under Proton Irradiation. 69. 2022
- Comparison of parallel implementation strategies in GPU-accelerated System-on-Chip under proton irradiation. 69:444-452. 2022
- Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOS. 69:462-469. 2021
- Microprocessor error diagnosis by trace monitoring under laser testing. 68:1651-1659. 2021
- Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace Monitoring. 67:1452-1460. 2020
- The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis. 67:126-134. 2020
- Online error detection through trace infrastructure in ARM microprocessors. 66:1457-1464. 2019
- Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation. 65:1835-1842. 2018
- A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA. 64:374-381. 2017
- Partial TMR in FPGAs Using Approximate Logic Circuits. 63:2233-2240. 2016
- Using Benchmarks for Radiation Testing of Microprocessors and FPGAs. 62:2547-2554. 2015
- A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring. 61:3236-3243. 2014
- Efficient mitigation of data and control-flow errors in microprocessors. 61:1590-1596. 2014
- A co-design approach for SET mitigation in embedded systems. 59:1034-1039. 2012
- Constrained Placement Methodology for Reducing SER Under Single-Event-Induced Charge Sharing Effects. 59:811-817. 2012
- Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits. 58 :2768-2775. 2011
- GPU-based fast iterative reconstruction of fully 3-D PET sinograms. 58:2257-2263. 2011
- Analysis of SET effects in a PIC microprocessor for selective hardening. 58:1078-1085. 2011
- NEMA NU 4-2008 performance measurements of two commercial small-animal PET scanners: ClearPET and rPET-1. 58:58-65. 2011
- A SPECT scanner for rodent imaging based on small-area gamma cameras. 57:2524-2531. 2010
- Effects of the super Bialkali photocathode on the performance characteristics of a position-sensitive depth-of-interaction PET detector module. 57:2437-2441. 2010
- SET Emulation Considering Electrical Masking Effects. 56:2015-2021. 2009
- Analysis of Turbo Decoder Robustness Against SEU Effects. 56:2184-2188. 2009
International Standard Serial Number (ISSN)
- 0018-9499
Electronic International Standard Serial Number (EISSN)
- 1558-1578