Microprocessor error diagnosis by trace monitoring under laser testing Articles uri icon

publication date

  • August 2021

start page

  • 1651

end page

  • 1659

issue

  • 8

volume

  • 68

International Standard Serial Number (ISSN)

  • 0018-9499

Electronic International Standard Serial Number (EISSN)

  • 1558-1578

abstract

  • This work explores the diagnosis capabilities of the enriched information provided by microprocessors trace subsystem combined with laser fault injection. Laser fault injection campaigns with delimited architectural regions have been accomplished on an ARM Cortex-A9 device. Experimental results demonstrate the capability of the presented technique to provide additional information of the various error mechanisms that can happen in a microprocessor. A comparison with radiation campaigns presented in previous work is also discussed, showing that laser fault injection results are in good agreement with neutron and proton radiation results.

keywords

  • arm; error diagnosis; fault tolerance; laser fault injection; microprocessor trace