Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation Articles uri icon

publication date

  • August 2018

start page

  • 1835

end page

  • 1842

issue

  • 8

volume

  • 65

International Standard Serial Number (ISSN)

  • 0018-9499

Electronic International Standard Serial Number (EISSN)

  • 1558-1578

abstract

keywords

  • arm; fault tolerance; neon; single instruction multiple data (simd); software hardening