Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation Articles

authors

published in

IEEE TRANSACTIONS ON NUCLEAR SCIENCE Journal

publication date

August 2018

start page

1835

end page

1842

issue

8

volume

65

Digital Object Identifier (DOI)

https://doi.org/10.1109/tns.2018.2823540

full text

http://hdl.handle.net/10016/32738

International Standard Serial Number (ISSN)

0018-9499

Electronic International Standard Serial Number (EISSN)

1558-1578

abstract

subjects

Electronics

keywords

arm; fault tolerance; neon; single instruction multiple data (simd); software hardening