Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits Articles uri icon

publication date

  • December 2011

start page

  • 2768

end page

  • 2775

issue

  • 6

volume

  • 58

international standard serial number (ISSN)

  • 0018-9499

electronic international standard serial number (EISSN)

  • 1558-1578

abstract

  • This paper proposes a soft error characterization methodology to analyze multiple faults caused by single-event-induced charge sharing in standard-cell based ASIC designs. Fault injection campaigns have been executed using data provided by placement analysis as well as a pulse width modeling through electrical simulation. Experimental results demonstrate that the error rate can be largely overestimated if placement is not considered.

keywords

  • fault injection; placement; soft error rate (ser); single-event-induced charge sharing