The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis Articles uri icon

publication date

  • January 2020

start page

  • 126

end page

  • 134


  • 1


  • 67

International Standard Serial Number (ISSN)

  • 0018-9499

Electronic International Standard Serial Number (EISSN)

  • 1558-1578


  • This work proposes a methodology to diagnoseradiation-induced faults in a microprocessor using the hardwaretrace infrastructure. The diagnosis capabilities of this approachare demonstrated for an ARM microprocessor under neutronand proton irradiation campaigns. The experimental resultsdemonstrate that the execution status in the precise moment thatthe error occurred can be reconstructed, so that error diagnosiscan be achieved.


  • Electronics


  • arm; fault diagnosis; fault tolerance; microprocessor trace; single-event effects