Constrained Placement Methodology for Reducing SER Under Single-Event-Induced Charge Sharing Effects Articles uri icon

publication date

  • August 2012

start page

  • 811

end page

  • 817

issue

  • 4

volume

  • 59

international standard serial number (ISSN)

  • 0018-9499

electronic international standard serial number (EISSN)

  • 1558-1578

abstract

  • This paper presents a methodology to reduce the impact of double faults in a circuit by constraining the placement of its standard cells. A fault-injection emulation platform is used to analyze the single-event-induced charge sharing effect in every pair of nodes. Based on the sensitivity of each pair, guidelines are set in a commercial standard cell placement by using constraints. Results show that by correctly choosing the nodes location, the error rate resulting from double faults can be reduced compared to single fault.