Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions
Articles
Overview
published in
- MICROELECTRONICS RELIABILITY Journal
publication date
- September 2019
start page
- 113346
volume
- 100-101
Digital Object Identifier (DOI)
full text
International Standard Serial Number (ISSN)
- 0026-2714
abstract
Classification
subjects
- Electronics