Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions Articles

authors

published in

MICROELECTRONICS RELIABILITY Journal

publication date

September 2019

start page

113346

volume

100-101

Digital Object Identifier (DOI)

https://doi.org/10.1016/j.microrel.2019.06.038

full text

http://hdl.handle.net/10016/32739

International Standard Serial Number (ISSN)

0026-2714

Electronic International Standard Serial Number (EISSN)

1872-941X

abstract

subjects

Electronics