Error masking with approximate logic circuits using dynamic probability estimations Conference Contributions uri icon

event

  • 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)

event place

  • GIRONA

participation category

  • COMUNICACIÓN

publication date

  • 2014

start page

  • 134

end page

  • 139

keywords

  • approximation theory; circuit reliability; error statistics; estimation theory; logic circuits