authors LEON, GERMAN BADIA, JOSE M. BELLOCH RODRIGUEZ, JOSE ANTONIO LINDOSO MUĂ‘OZ, ALMUDENA ENTRENA ARRONTES, LUIS ALFONSO
event 31th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020)
main title Microelectronics reliability, Special issue: Proceedings of ESREF 2020, 31th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis