Logic Masking for SET Mitigation Using Approximate Logic Circuits Conference Contributions uri icon

event

  • 18th International On-Line Testing Symposium (IOLTS 2012)

event place

  • SITGES

participation category

  • COMUNICACIÓN

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2012

start page

  • 176

end page

  • 181

isbn

  • 978-1-4673-2082-5

keywords

  • approximation methods; circuit faults; logic circuits; logic gates; vectors; transient analysis; logic functions