Co-author Network

Co-researcher Network

LOPEZ ONGIL, CELIA Close

category: Associate Professor

https://orcid.org/0000-0001-9451-6611

Positions

Academic Department : Electronic Technology
Research Group : Microelectronic Design and Applications (DMA)
Institute : University Institute on Gender Studies

Contact Info

celia@ing.uc3m.es >> Other Contact Information

Publications
Projects
Other

sample of publications

articles
- Early SEU sensitivity assessment for collaborative hardening techniques: A case study of OPTOS processing architecture. MICROELECTRONICS RELIABILITY. 95:36-47. 2019
- Data Analysis and Results of the Radiation-Tolerant Collaborative Computer On-Board OPTOS CubeSat. International Journal of Aerospace Engineering. 2019
- Low-Power Design in Aerospace Circuits: A Case Study. IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE. 28:46-52. 2013
- SEU Sensitivity Comparison for Different Reprogrammable Technologies With Minority Check Block. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 60:2813-2818. 2013
- Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 28:777-789. 2012
- On the use of embedded debug features for permanent and transient fault resilience in microprocessors. MICROPROCESSORS AND MICROSYSTEMS. 36:334-343. 2012
- Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection. IEEE TRANSACTIONS ON COMPUTERS. 61:313-322. 2012
- Analysis of SET effects in a PIC microprocessor for selective hardening. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 58:1078-1085. 2011
- Sensitivity Evaluation Method for Aerospace Digital Systems With Collaborative Hardening. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 58:1053-1058. 2011
- Fault Injection in Modern Microprocessors Using On-Chip Debugging Infrastructures. IEEE Transactions on Dependable and Secure Computing. 8:308-314. 2011
- Extensive SEU Impact Analysis of a PIC Microprocessor for Selective Hardening. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 57:1986-1991. 2010
- SET Emulation Considering Electrical Masking Effects. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 56:2015-2021. 2009
- Analysis of Turbo Decoder Robustness Against SEU Effects. IEEE TRANSACTIONS ON NUCLEAR SCIENCE. 56:2184-2188. 2009
- SET Emulation under a Quantized Delay Model. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 25:107-116. 2009
book chapters
- Hardware Fault Injection. In: Soft Errors in Modern Electronic Systems. SPRINGER. 141-166. 2010
conference contributions