Assesing SET Sensitivity of PLL Conference Contributions uri icon

event

  • Conference on Design of Circuits and Integrated Systems (DCIS)

event place

  • MADRID

participation category

  • CONFERENCIA

main title

  • Conference on Design of Circuits and Integrated Circuits (DCIS), Madrid, 26-28 Nov. 2014 : [proceedings]

publication date

  • 2014

start page

  • 1

end page

  • 6

isbn

  • 978-1-4799-5743-9

keywords

  • radiation effects; set; fault injection; pll sensitivity; mixed-signal