Effect of ionizing radiation on TRNGs for safe telecommunications: robustness and randomness Conference Contributions uri icon

event

  • 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)

event place

  • PLATJA D'ARO

participation category

  • P├ôSTER

main title

  • Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)

publication date

  • 2014

start page

  • 202

end page

  • 205

isbn

  • 978-1-4799-5324-0

keywords

  • ionaizing radiation; seu; trng; reliability; fault-tolerant