Approximate logic functions for SET mitigation in sequential circuits Conference Contributions uri icon

event

  • XXVII International Conference on Design of Circuits and Integrated Circuits (DCIS 2012)

event place

  • AVIGNON

country

  • FRANCIA

participation category

  • CONFERENCIA

publication date

  • 2012

start page

  • 195

end page

  • 200

isbn

  • 978295174614

keywords

  • soft error; error detection and correction; sequential circuits; approximate logic function; testability