About the Functional Test of Permanent Faults in Distributed Systems Conference Contributions uri icon

event

  • 2015 Conference on Design of Circuits and Integrated Systems (DCIS)

event place

  • ESTORIL

country

  • PORTUGAL

participation category

  • COMUNICACIÓN

main title

  • 2015 Conference on Design of Circuits and Integrated Systems (DCIS), Estoril, Portugal, November 25-27, 2015

publication date

  • 2015

start page

  • 1

end page

  • 6

isbn

  • 978-1-4673-7228-2

keywords

  • power distribution faults;power distribution reliability;distributed system;permanent faults functional test;digital electronic systems;distributed electronic system;low observability;circuit faults;fault diagnosis;solid modeling;testing;hardware;clocks;permanent faults;lin bus;on-line testing;graceful degradation