Assessing SET sensitivity of a PLL Conference Contributions uri icon

event

  • 2014 Conference on Design of Circuits and Integrated Circuits (DCIS)

event place

  • MADRID

participation category

  • COMUNICACIÓN

publication date

  • 2014

start page

  • 1

end page

  • 6

keywords

  • cmos integrated circuits; integrated circuit reliability; phase locked loops; radiation hardening (electronics); transients