A method to assess the robustness of cryptographic circuits at the design stage Conference Contributions uri icon

event

  • 27th Conference on Design of Circuits and Integrated Systems (DCIS 2012)

event place

  • AVIGNON

country

  • FRANCIA

participation category

  • COMUNICACIÓN

publication date

  • 2014

start page

  • 1354

end page

  • 1360

keywords

  • cryptographic circuits ; differential fault attacks; fault-based attack; fault injection ; single event transient