Evaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessor Conference Contributions uri icon

event

  • 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021)

event place

  • Burdeos (Conferencia online)

country

  • FRANCIA

participation category

  • PONENCIA

main title

  • Microelectronics reliability, Special issue: Proceedings of ESREF 2021, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

edition country

  • PAISES BAJOS (parte europea)

publication date

  • 2021

start page

  • 1

end page

  • 6

isbn

  • 0026-2714

keywords

  • arm; exceptions; reliability; fault injection; radiation effects