Evaluating reliability through soft error triggered exceptions at ARM Cortex-A9 microprocessor
Conference Contributions
Overview
event
- 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021)
event place
- Burdeos (Conferencia online)
country
- FRANCIA
participation category
- PONENCIA
web site
main title
- Microelectronics reliability, Special issue: Proceedings of ESREF 2021, 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
edition country
- PAISES BAJOS (parte europea)
publisher
publication date
- 2021
start page
- 1
end page
- 6
isbn
- 0026-2714
Digital Object Identifier (DOI)
full text
Classification
keywords
- arm; exceptions; reliability; fault injection; radiation effects