Impact of atmospheric and space radiation on sensitive electronic devices Conference Contributions uri icon

event

  • 27th IEEE European Test Symposium (ETS 2022)

event place

  • BARCELONA

participation category

  • PONENCIA

main title

  • Proceedings of 2022 IEEE European Test Symposium (ETS)

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2022

isbn

  • 978-1-6654-6706-3

subjects

  • Computer Science
  • Electronics
  • Mechanical Engineering
  • Nuclear Energy
  • Telecommunications

keywords

  • radiation; environments; simulation tools; total ionizing dose; single-event effects; memory; processor