High complexity reliable Space applications in commercial microprocessors
Conference Contributions
Overview
event
- 33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF) 2022
event place
- BERLIN
country
- ALEMANIA
participation category
- PONENCIA
web site
main title
- Microelectronics reliability, Special issue: Proceedings of ESREF 2022, 33rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
publisher
publication date
- 2022
start page
- 1
end page
- 5
isbn
- 0026-2714
Digital Object Identifier (DOI)
Classification
keywords
- microprocessor; fault tolerance; reliability; cots; lockstep; hardening