High complexity reliable Space applications in commercial microprocessors Conference Contributions uri icon

event

  • 33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF) 2022

event place

  • BERLIN

country

  • ALEMANIA

participation category

  • PONENCIA

main title

  • Microelectronics reliability, Special issue: Proceedings of ESREF 2022, 33rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

publication date

  • 2022

start page

  • 1

end page

  • 5

isbn

  • 0026-2714

keywords

  • microprocessor; fault tolerance; reliability; cots; lockstep; hardening