sample of publications

• articles 

  • On the Privacy of Counting Bloom Filters Under a Black-Box Attacker.  IEEE Transactions on Dependable and Secure Computing.  20. 2023
  • Towards an error-free 3-D memory for space applications.  ADVANCES IN SPACE RESEARCH.  70:1917-1924. 2022
  • Attacking Adaptive Cuckoo Filters: Too Much Adaptation Can Kill You.  IEEE Transactions on Network and Service Management.  19:5224-5236. 2022
  • Adaptive one memory access bloom filters.  IEEE Transactions on Network and Service Management.  19:848-859. 2022
  • Reducing the Impact of Defects in Quantum-Dot Cellular Automata (QCA) Approximate Adders at Nano Scale.  IEEE Transactions on Emerging Topics in Computing.  10:635-647. 2022
  • On the privacy of counting Bloom filters.  IEEE Transactions on Dependable and Secure Computing.  20:1488 -1499. 2022
  • An Analysis of FPGA Configuration Memory SEU Accumulation and a Preventative Scrubbing Technique.  MICROPROCESSORS AND MICROSYSTEMS.  90. 2022
  • Design and implementation of efficient QCA full-adders using fault-tolerant majority gates.  JOURNAL OF SUPERCOMPUTING.  78:8056-8080. 2022
  • Combined Symbol Error Correction and Spare Through-Silicon Vias for 3D Memories.  IEEE Transactions on Emerging Topics in Computing.  9:2139-2145. 2021
  • On the Security of the K Minimum Values (KMV) Sketch.  IEEE Transactions on Dependable and Secure Computing.  19:3539-3545. 2021
  • Fault Injection Emulation for Systems in FPGAs: Tools, Techniques and Methodology, a Tutorial.  SENSORS.  21:1-23. 2021
  • Reduced length redundancy adaptive protection for the cascaded integrator-comb interpolation filter on FPGA.  MICROELECTRONICS RELIABILITY.  118:1-6. 2021
  • Low-Latency and Low-Power Test-Vector Selector for Reed-Solomon's Low-Complexity Chase.  IEEE Transactions on Circuits and Systems II: Express Briefs.  67:3362-3366. 2020
  • Decoding Algorithm for Quadruple-Error-Correcting Reed-Solomon Codes and Its Derived Architectures.  IEEE Transactions on Circuits and Systems II: Express Briefs.  68:1438-1442. 2020
  • A Methodology to Analyze the Fault Tolerance of Demosaicking Methods against Memory Single Event Functional Interrupts (SEFIs).  Electronics.  9:1-12. 2020
  • Low delay non-binary error correction codes based on Orthogonal Latin Squares.  INTEGRATION-THE VLSI JOURNAL.  76:55-60. 2020
  • Extended symbol correction algorithm for group testing based non-binary error correction codes of minimum distance dq.  MICROELECTRONICS RELIABILITY.  113:1-5. 2020
  • An algorithmic-based fault detection technique for the 1-d discrete cosine transform.  IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS.  28:1336-1340. 2020
  • Radiation Hardened Digital Direct Synthesizer With CORDIC for Spaceborne Applications.  IEEE Access.  8:83167-83176. 2020
  • Two Behavioural Error Detection Techniques for the Cascaded Integrator-Comb Interpolation Filter Implemented on FPGA.  CIRCUITS SYSTEMS AND SIGNAL PROCESSING.  39:5529-5542. 2020
  • Efficient Majority-Logic Reed-Solomon Decoders for Single Symbol Correction.  IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY.  20:390-394. 2020
  • Analysis of the Critical Bits of a RISC-V Processor Implemented in a SRAM-based FPGA for Space Applications.  Electronics.  9. 2020
  • Enhanced Limited Magnitude Error Correcting Codes for Multilevel Cell Main Memories.  IEEE TRANSACTIONS ON NANOTECHNOLOGY.  18:1023-1026. 2019
  • Reducing false positives due to double adjacent errors in instruction TLBs.  MICROELECTRONICS RELIABILITY.  102:1-6. 2019
  • ACME: A Tool to Improve Configuration Memory Fault Injection in SRAM-Based FPGAs.  IEEE Access.  7:128153-128161. 2019
  • Reliability of 3D Memories Using Orthogonal Latin Square codes.  MICROELECTRONICS RELIABILITY.  95:74-80. 2019
  • Multiple Cell Upset Injection in BRAMs for Xilinx FPGAs.  IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY.  18:636-638. 2018
  • Enhancing Instruction TLB Resilience to Soft Errors.  IEEE TRANSACTIONS ON COMPUTERS.  68:214-224. 2018
  • SEU and SEFI Error Detection and Correction on a DDR3 Memory System.  MICROELECTRONICS RELIABILITY.  91, 1:23-30. 2018
  • Modular Fault Tolerant Processor Architecture on a SoC for Space.  MICROELECTRONICS RELIABILITY.  83:84-90. 2018