A Methodology to Analyze the Fault Tolerance of Demosaicking Methods against Memory Single Event Functional Interrupts (SEFIs)

Electronic circuits in harsh environments, such as space, are affected by soft errors produced by radiation. A single event functional interrupt (SEFI) can affect the behavior of a memory chip, with one or more rows, columns or even the whole device producing a wrong value when reading a set of stored bits. This problem may affect raw Bayer images stored in satellites and other spacecraft. In this paper, we present a methodology to analyze how different interpolation algorithms behave when they try to reconstruct the affected Bayer images into standard red, green and blue (RGB) images. This methodology can be used to compare and develop new fault-tolerant algorithms. The proposed methodology has been illustrated by studying a subset of interpolation algorithms. The results obtained from this example show that the interpolation algorithms that traditionally offer better results in a normal operation (in the absence of errors) are not always the best when SEFI errors are present in the Bayer images.

A Methodology to Analyze the Fault Tolerance of Demosaicking Methods against Memory Single Event Functional Interrupts (SEFIs) Articles