Deep-learning based scatter correction in digital radiography Conference Contributions uri icon

event

  • IST 2021: IEEE International Conference on IMAGING SYSTEMS & TECHNIQUES

event place

  • New York (Virtual Conference)

country

  • ESTADOS UNIDOS DE AMERICA

participation category

  • P├ôSTER

main title

  • Proceedings of 2021 IEEE International Conference on Imaging Systems and Techniques (IST)

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2021

isbn

  • 978-1-7281-7371-9

subjects

  • Aeronautics
  • Biology and Biomedicine
  • Materials science and engineering
  • Mechanical Engineering
  • Naval Engineering

keywords

  • deep learning; digital radiography; compton scatter; x-ray