Universal fluctuations of global geometrical measurements in planar clusters Articles uri icon

publication date

  • March 2024

start page

  • 034127

issue

  • 3

volume

  • 109

International Standard Serial Number (ISSN)

  • 2470-0045

Electronic International Standard Serial Number (EISSN)

  • 2470-0053

abstract

  • We characterize universal features of the sample-to-sample fluctuations of global geometrical observables, such as the area, width, length, and center-of-mass position, in random growing planar clusters. Our examples are taken from simulations of both continuous and discrete models of kinetically rough interfaces, including several universality classes, such as Kardar-Parisi-Zhang. We mostly focus on the scaling behavior with time of the sample-to-sample deviation for those global magnitudes, but we have also characterized their histograms and correlations.

subjects

  • Mathematics
  • Physics