JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS Journal

Overview

abbreviation

J ELECTRON TEST

publication venue for

Low Delay 3-Bit Burst Error Correction Codes. 35:413-420. 2019
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. 28:777-789. 2012
SET Emulation under a Quantized Delay Model. 25:107-116. 2009

International Standard Serial Number (ISSN)

0923-8174

Electronic International Standard Serial Number (EISSN)

1573-0727