Reliability evaluation of digital channelizers implemented on SRAM-FPGAs Conference Contributions uri icon

authors

  • GAO, ZHEN
  • XIAO, JIAJUN
  • REVIRIEGO VASALLO, PEDRO

event

  • DFT 2021: 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

event place

  • Athens (Virtual event)

country

  • GRECIA

participation category

  • PONENCIA

main title

  • Proceedings of 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2021

isbn

  • 978-1-6654-1609-2

subjects

  • Computer Science
  • Electronics
  • Telecommunications

keywords

  • digital channelizer; reliability; sram-fpgas; single event upsets; fault injection