Isolation design flow effectiveness evaluation methodology for zynq SoCs Articles

authors

Malik, Arsalan Ali
Ullah, Anees
Zahir, Ali
Qamar, Affaq
Khattak, Shadan Khan
REVIRIEGO VASALLO, PEDRO

published in

Electronics (Switzerland) Journal

publication date

January 2020

issue

5

volume

9

Digital Object Identifier (DOI)

https://doi.org/10.3390/electronics9050814

keywords

design failure; fault injection; fpgas; isolation design flow; processor configuration access port (pcap)