Selective Fault Tolerance by Counting Gates with Controlling Value Conference Contributions uri icon

authors

event

  • 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

event place

  • RODAS

country

  • GRECIA

participation category

  • PONENCIA

main title

  • 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2019

start page

  • 15

end page

  • 20

isbn

  • 978-1-7281-2491-9

keywords

  • fault injection; logical masking; selective fault tolerance; single event upset; soft errors; structural netlist analysis; susceptibility analysis