Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime Conference Contributions uri icon

event

  • IEEE Statistical Signal Processing Workshop (SSP 2016)

event place

  • PALMA DE MALLORCA

participation category

  • PONENCIA

publication date

  • 2016

start page

  • 1

end page

  • 5

isbn

  • 978-1-4673-7802-4