Optical properties of carbon nanotube thin films in subterahertz frequency regime Articles uri icon

authors

  • PUTHUKODAN, SUJITHA
  • DADRASNIA, EHSAN
  • V K THALAKKATUKALATHIL, VINOD
  • LAMELA RIVERA, HORACIO
  • LAMPIN, JEAN FRANçOIS

publication date

  • August 2014

start page

  • 1895

end page

  • 1898

issue

  • 8

volume

  • 56

International Standard Serial Number (ISSN)

  • 0895-2477

Electronic International Standard Serial Number (EISSN)

  • 1098-2760

abstract

  • Multiwalled carbon nanotube (MWCNT) thin films deposited on fused quartz substrates are characterized by continuous wave subterahertz free space technique using a vector network analyzer (VNA). The scattering (S) parameters are measured by a VNA in the frequency range of 220-325 GHz (G-band) and 325-500 GHz (Y-band). The complex refractive index is extracted with the help of Nicholson-Ross-Weir method. The transmission and absorption of the thin films are also studied. VNA offers a good spectral resolution and a dynamic range of 60-70 dB around 500 GHz. The experimental technique and material parameter extraction procedures are described. The refractive index, transmission and absorption coefficient obtained for MWCNT thin films are plotted and the results are discussed.

keywords

  • carbon nanotubes; continuous wave terahertz measurement; vector network analyzer; rerfractive index; absorption coefficient