Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser Articles uri icon

authors

  • PUTHUKODAN, SUJITHA
  • DADRASNIA, EHSAN
  • V K THALAKKATUKALATHIL, VINOD
  • NGUENDON KENHAGHO, HERVE
  • LAMELA RIVERA, HORACIO
  • LAMPIN, J.-F.
  • GARET, FREDERIC
  • COUTAZ, JEAN-LOUIS
  • LEE, D. M.
  • BAIK, S.

publication date

  • February 2014

start page

  • 297

end page

  • 298

issue

  • 4

volume

  • 50

International Standard Serial Number (ISSN)

  • 0013-5194

Electronic International Standard Serial Number (EISSN)

  • 1350-911X

abstract

  • A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.

keywords

  • microwave-frequencies; permeability