Current Issues with Assessment Formats and Interoperability Conference Contributions uri icon

event

  • 2010 IEEE Annual Global Engineering Education Conference (EDUCON)

event place

  • MADRID

participation category

  • COMUNICACIÓN

main title

  • IEEE International Conference EDUCON: Proceedings of the 2010 IEEE Global Engineering Education Conference (EDUCON), Madrid, Spain, 14-16 April, 2010 (2010)

publication date

  • 2010

start page

  • 1247

end page

  • 1252

isbn

  • 978-1-4244-6568-2

keywords

  • assessment format; interoperability; ims qti