Critical Thickness for Misfit Dislocation Formation in InAs/GaAs(110) Heteroepitaxy Conference Contributions uri icon

event

  • 14th European Conference on Mathematics for Industry (ECMI 2006)

event place

  • LEGANES

participation category

  • PONENCIA

edition country

  • ALEMANIA

publication date

  • 2008

start page

  • 381

end page

  • 386

isbn

  • 978-3-540-71991-5

series title / series number

  • Mathematics in Industry

issue

  • 12