IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY Journal

Overview

abbreviation

IEEE T DEVICE MAT RE

publication venue for

Correction Masking: a technique to implement efficient SET tolerant error correction decoders. 22:36-41. 2022
Efficient Majority-Logic Reed-Solomon Decoders for Single Symbol Correction. 20:390-394. 2020
Multiple Cell Upset Injection in BRAMs for Xilinx FPGAs. 18:636-638. 2018

International Standard Serial Number (ISSN)

1530-4388

Electronic International Standard Serial Number (EISSN)

1558-2574