Reliability evaluation of the count min sketch (CMS) against single event transients (SETs) Conference Contributions uri icon

authors

  • Zhu, Jinhua
  • Gao, Zhen
  • Jin, Jie
  • REVIRIEGO VASALLO, PEDRO

event

  • Proceedings of the IEEE VLSI Test Symposium

participation category

  • P├ôSTER

publication date

  • 2021

keywords

  • count min sketch; reliability; single event transients