Reliability evaluation of the count min sketch (CMS) against single event transients (SETs) Conference Contributions uri icon

authors

  • Zhu, Jinhua
  • Gao, Zhen
  • Jin, Jie
  • REVIRIEGO VASALLO, PEDRO

event

  • Proceedings of the IEEE VLSI Test Symposium

event place

  • San Diego

country

  • ESTADOS UNIDOS DE AMERICA

participation category

  • CONFERENCIA

main title

  • Proceedings: 2021 IEEE 39th VLSI Test Symposium (VTS)

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2021

start page

  • 1

end page

  • 6

isbn

  • 978-1-6654-1949-9

subjects

  • Computer Science
  • Telecommunications

keywords

  • count min sketch; reliability; single event transients