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Reliability evaluation of the count min sketch (CMS) against single event transients (SETs)
Conference Contributions
Overview
Classification
Overview
authors
Zhu, Jinhua
Gao, Zhen
Jin, Jie
REVIRIEGO VASALLO, PEDRO
event
Proceedings of the IEEE VLSI Test Symposium
participation category
PÓSTER
publication date
2021
Digital Object Identifier (DOI)
https://doi.org/10.1109/vts50974.2021.9441036
Classification
keywords
count min sketch; reliability; single event transients