Reliable Classification with Ensemble Convolutional Neural Networks Conference Contributions uri icon

authors

  • Gao, Zhen
  • Zhang, Han
  • Wei, Xiaohui
  • Yan, Tong
  • Guo, Kangkang
  • Li, Wenshuo
  • Wang, Yu
  • REVIRIEGO VASALLO, PEDRO

event

  • 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020

participation category

  • P├ôSTER

publication date

  • 2020

keywords

  • convolutional neural networks (cnns); ensemble; reliability; resnet