authors
- GAO, ZHEN
- ZHU, JINHUA
- YAN, LINA
- YAN, TONG
- REVIRIEGO VASALLO, PEDRO
Reliability evaluation of polyphase-filter based decimators implemented on SRAM-FPGAs
Conference Contributions
Overview
event
- 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019
event place
- Noordwijk
country
- PAISES BAJOS (parte europea)
participation category
- PONENCIA
web site
main title
- 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019
edition country
- ESTADOS UNIDOS DE AMERICA
publisher
publication date
- 2019
start page
- 1
end page
- 4
isbn
- 978-1-7281-2260-1
Digital Object Identifier (DOI)
Classification
keywords
- decimation; polyphase filters; reliability; single event upsets; fpgas