Protecting large word size memories against MCUs with 3-bit burst error correction Conference Contributions uri icon

event

  • 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019

event place

  • Noordwijk

country

  • HOLANDA - PAISES BAJOS

participation category

  • PONENCIA

main title

  • 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2019

start page

  • 1

end page

  • 4

isbn

  • 978-1-7281-2260-1

keywords

  • error correction codes; memories; multiple cell upsets