Advances in artefact quality analysis for safety-critical systems Conference Contributions uri icon

authors

  • PARRA CORREDOR, EUGENIO
  • Alonso, Luis
  • MENDIETA ZUNIGA, ROY ARTURO
  • VARA GONZALEZ, JOSE LUIS DE LA

event

  • Proceedings - 2019 IEEE 30th International Symposium on Software Reliability Engineering Workshops, ISSREW 2019

event place

  • BERLIN

country

  • ALEMANIA

participation category

  • CONFERENCIA

edition country

  • ALEMANIA

publication date

  • 2019

start page

  • 79

end page

  • 84

isbn

  • 978-1-7281-5138-0

keywords

  • artefact; practice; quality; safety-critical systems; the reuse company