Free space material characterization of carbon nanotube thin films at sub-terahertz frequencies Articles uri icon

authors

  • PUTHUKODAN, SUJITHA
  • DADRASNIA, EHSAN
  • V K THALAKKATUKALATHIL, VINOD
  • LAMELA RIVERA, HORACIO
  • LAMPIN, JEAN-FRANCOIS

publication date

  • March 2016

start page

  • 589

end page

  • 598

issue

  • 5

volume

  • 30

International Standard Serial Number (ISSN)

  • 0920-5071

Electronic International Standard Serial Number (EISSN)

  • 1569-3937

abstract

  • A free space, non-destructive, vectorial continuous wave terahertz analysis method is employed to study the material properties of single-walled and multi-walled carbon nanotube thin films deposited on substrates of fused quartz and silicon. The electrical and optical properties of the thin films have been investigated using a vector network analyzer, in the frequency range of 220-325 GHz (WR 3.4) and 325-500 GHz (WR 2.2). The Nicolson-Ross-Weir method is used to extract the material parameters. The refractive index, absorption coefficient, and the complex conductivity of the single-walled and multi-walled carbon nanotube thin films are extracted and studied.

keywords

  • Continuous wave terahertz, Vector network analyzer, Carbon nanotubes, Refractive index, Absorption, Conductivity