electronic international standard serial number (EISSN)
This work introduces a methodology for the simultaneous optimization of tolerances and parameters when the variables are correlated, and without any distributional assumption in the design factors. Therefore, the proposal covers a very general case. Tolerances can be asymmetric depending not only on variables distribution but also on the definition of the specification region. This flexibility allows larger tolerances than competing approaches. A simulation exercise is provided illustrating the advantage of the methodology.