CCD image sensor induced error in PIV applications Articles uri icon

authors

  • LEGRAND, MATHIEU
  • NOGUEIRA GORIBA, JOSE IGNACIO
  • VARGAS MELENDEZ, ALBERT ALEXANDER
  • VENTAS GARZON, RUBEN
  • RODRIGUEZ HIDALGO, MARIA CARMEN

publication date

  • May 2014

issue

  • 6

volume

  • 25

International Standard Serial Number (ISSN)

  • 0957-0233

Electronic International Standard Serial Number (EISSN)

  • 1361-6501

abstract

  • The readout procedure of charge-coupled device (CCD) cameras is known to generate some image degradation in different scientific imaging fields, especially in astrophysics. In the particular field of particle image velocimetry (PIV), widely extended in the scientific community, the readout procedure of the interline CCD sensor induces a bias in the registered position of particle images. This work proposes simple procedures to predict the magnitude of the associated measurement error. Generally, there are differences in the position bias for the different images of a certain particle at each PIV frame. This leads to a substantial bias error in the PIV velocity measurement (∼0.1 pixels). This is the order of magnitude that other typical PIV errors such as peak-locking may reach. Based on modern CCD technology and architecture, this work offers a description of the readout phenomenon and proposes a modeling for the CCD readout bias error magnitude. This bias, in turn, generates a velocity measurement bias error when there is an illumination difference between two successive PIV exposures. The model predictions match the experiments performed with two 12-bit-depth interline CCD cameras (MegaPlus ES 4.0/E incorporating the Kodak KAI-4000M CCD sensor with 4 megapixels). For different cameras, only two constant values are needed to fit the proposed calibration model and predict the error from the readout procedure. Tests by different researchers using different cameras would allow verification of the model, that can be used to optimize acquisition setups. Simple procedures to obtain these two calibration values are also described. © 2014 IOP Publishing Ltd.

keywords

  • engineering controlled terms: astrophysics; calibration; charge coupled devices; errors; flow visualization; sensors; velocimeters; velocity measurement; bias error; ccd imaging; error assessment; particle image velocimetries; readout procedure; ccd cameras