Sub-THz Characterisation of Monolayer Graphene Articles uri icon

authors

  • DADRASNIA, EHSAN
  • PUTHUKODAN, SUJITHA
  • V K THALAKKATUKALATHIL, VINOD
  • LAMELA RIVERA, HORACIO
  • DUCOURNAU, GUILLAUME
  • GARET, FREDERIC
  • LAMPIN, J.-F.
  • COUTAZ, JEAN-LOUIS

publication date

  • July 2014

volume

  • 2014

International Standard Serial Number (ISSN)

  • 2314-4939

abstract

  • We explore the optical and electrical characteristics of monolayer graphene by using pulsed optoelectronic terahertz time-domain spectroscopy in the frequency range of 325&-500 GHz based on fast direct measurements of phase and amplitude. We also show that these parameters can, however, be measured with higher resolution using a free space continuous wave measurement technique associated with a vector network analyzer that offers a good dynamic range. All the scattering parameters (both magnitude and phase) are measured simultaneously. The Nicholson-Ross-Weir method is implemented to extract the monolayer graphene parameters at the aforementioned frequency range.

keywords

  • monolayer graphene; pulsed optoelectronic terahertz time-domain spectroscopy; higher resolution; free space continuous wave measurement technique; vector network analyzer; nicholson-ross-weir method