Embedded Power Quality Monitoring System Based on Independent Component Analysis and SVMs Conference Contributions uri icon

authors

event

  • 2011 IEEE International Joint Conference on Neural Networks

event place

  • SAN JOSE, CALIFORNIA

country

  • ESTADOS UNIDOS DE AMERICA

participation category

  • PONENCIA

edition country

  • ESTADOS UNIDOS DE AMERICA

publication date

  • 2011

start page

  • 2229

end page

  • 2234

isbn

  • 978-1-4244-9635-8