authors
- PERIS LOPEZ, PEDRO
- LI, TIEYAN
- LIM, TONG-LEE
- HERNANDEZ CASTRO, JULIO CESAR
- ESTEVEZ TAPIADOR, JUAN MANUEL
Vulnerability Analysis of a Mutual Authentication Scheme under the EPC Class-1 Generation-2 Standard
Conference Contributions
Overview
event
- Workshop on RFID Security (RFIDSec'08)
event place
- BUDAPEST
country
- HUNGRÍA
participation category
- CONFERENCIA
publication date
- 2008