Test Driven Development of a Substructuring Technique for the Analysis of Electromagnetic Finite Periodic Structures Articles uri icon

publication date

  • December 2021

start page

  • 1

end page

  • 18


  • 24


  • 11

International Standard Serial Number (ISSN)

  • 2076-3417


  • In this paper, we follow the Test-Driven Development (TDD) paradigm in the development
    of an in-house code to allow for the finite element analysis of finite periodic type electromagnetic
    structures (e.g., antenna arrays, metamaterials, and several relevant electromagnetic problems). We
    use unit and integration tests, system tests (using the Method of Manufactured Solutions—MMS),
    and application tests (smoke, performance, and validation tests) to increase the reliability of the code
    and to shorten its development cycle. We apply substructuring techniques based on the definition of a
    unit cell to benefit from the repeatability of the problem and speed up the computations. Specifically,
    we propose an approach to model the problem using only one type of Schur complement which has
    advantages concerning other substructuring techniques.


  • Industrial Engineering


  • test-driven development; verification and validation; finite element method; substructuring; techniques; finite periodic structures; computational electromagnetics